Ion Migration in p-Type Perovskite MAPbI3 Films under Electric Field and Thin-Film Transistor Device Failure

Chem. Commun., 2024, Accepted Manuscript DOI: 10.1039/D4CC03446E, Communication Jiale Su, Zhenxin Yang, Xuanhe Li, Fushun Li, Juntao Hu, Nan Chen, Tao Zhang, dengke wang, Zhenghong Lu, Qiang Zhu This study demonstrated a dynamic analysis to investigate the ion migration in p-type perovskite MAPbI3 films under an electric field, revealing its detrimental effects on the electrical performance of MAPbI3-based...