Author(s): Yoav Shimshi and Ephraim Shahmoon Critical metrology relies on the high sensitivity of systems to parameter changes near a phase transition to extract information with high precision. Such methods usually require working under adiabatic conditions, which implies long preparation times due to critical slowing down. Here instead we de… [Phys. Rev. Lett. 137, 103601] Published Tue Sep 01, 2026