Author(s): Miaomiao Wei, Bin Wang, Fuming Xu, and Jian Wang Finite-frequency local shot noise acting as a source of near-field radiation in topological conductors reveals a hidden energy-loss channel that does not rely on backscattering or dephasing and can be detected by near-field microscopy rather than conventional transport measurements. [Phys. Rev. Lett. 137, 046303] Published Wed Jul 22, 2026