Author(s): Yueyun Chen, Rebekah Jin, Yarin Heffes, Brian Zutter, Tristan P. O’Neill, Jared J. Lodico, B. C. Regan, and Matthew Mecklenburg Electron microscopy uses energy-dispersive x-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) for elemental analysis. EDS and EELS energy resolutions are commonly between 30 and 100 eV or 0.01 and 1 eV, respectively. Large solid angle EDS detector technology has increased collecti… [Phys. Rev. Lett. 135, 157002] Published Wed Oct 08, 2025